Introduction: Development Flow of an IC
Quality Control Environments
ATE Architecture
Analog Instruments
Basic Analog Measurement and Test Concepts (DC)
DAC testing
Data Analysis and Statistics
Sampling Theory and DSP-based Testing
ADC Testing
Design for Test
Typical Analog Issues / Pitfalls
RF Testing
Qualification of ICs
Failure Analysis of ICs
(automatisch geplant, erwartete Hörerzahl original: 20, fixe Veranstaltung: nein)
