Nanophysics using Scaning Probe Microscopy
- Dozent/in
- Prof. Dr. Sabine Maier
- Angaben
- Vorlesung
Online/Präsenz 2 SWS, ECTS-Studium, ECTS-Credits: 5, Sprache Englisch
Zeit und Ort: Di 14:15 - 16:00, SR 01.779
Vorbesprechung: 19.10.2021, 14:00 - 16:00 Uhr, Raum TL 1.140
- Studienfächer / Studienrichtungen
- WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1
WF LaP-SE ab 5
- Inhalt
- 1. Introduction in various scanning probe microscopy techniques
Scanning tunneling microscopy (STM)
Atomic force microscopy (AFM)
Kelvin probe force microscopy (KPFM)
Conductive atomic force microscopy (cAFM)
Scanning Near-field microscopy (SNOM)
2. Complementary surface-science techniques
3. Introduction to nanophysics
- Empfohlene Literatur
- 1. B. Voigtländer, Scanning Probe Micorsocpy, Springer 2015
2. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
3. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.
- ECTS-Informationen:
- Credits: 5
- Zusätzliche Informationen
- Zugeordnete Lehrveranstaltungen
- UE: Nanophysics using Scaning Probe Microscopy - Exercises
-
Dozent/in: Prof. Dr. Sabine Maier
Zeit und Ort: Di 16:00 - 17:00, SR 01.779; Bemerkung zu Zeit und Ort: The time for the exercises can be changed and will be discussed in the first meeting
- Verwendung in folgenden UnivIS-Modulen
- Startsemester WS 2021/2022:
- Nanophysics using Scaning Probe Microscopy (PW-NanoScan)
- Institution: Professur für Experimentalphysik (Rastersondenmikroskopie) (Prof. Dr. Maier)
|
|