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Nanophysics using Scaning Probe Microscopy
- Lecturer
- Prof. Dr. Sabine Maier
- Details
- Vorlesung
Online/Präsenz 2 cred.h, ECTS studies, ECTS credits: 5, Sprache Englisch
Time and place: Tue 14:15 - 16:00, SR 01.779
Preliminary meeting: 19.10.2021, 14:00 - 16:00 Uhr, room TL 1.140
- Fields of study
- WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1
WF LaP-SE ab 5
- Contents
- 1. Introduction in various scanning probe microscopy techniques
Scanning tunneling microscopy (STM)
Atomic force microscopy (AFM)
Kelvin probe force microscopy (KPFM)
Conductive atomic force microscopy (cAFM)
Scanning Near-field microscopy (SNOM)
2. Complementary surface-science techniques
3. Introduction to nanophysics
- Recommended literature
- 1. B. Voigtländer, Scanning Probe Micorsocpy, Springer 2015
2. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
3. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.
- ECTS information:
- Credits: 5
- Additional information
- Assigned lectures
- UE: Nanophysics using Scaning Probe Microscopy - Exercises
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Lecturer: Prof. Dr. Sabine Maier
Time and place: Tue 16:00 - 17:00, SR 01.779; comments on time and place: The time for the exercises can be changed and will be discussed in the first meeting
- Verwendung in folgenden UnivIS-Modulen
- Startsemester WS 2021/2022:
- Nanophysics using Scaning Probe Microscopy (PW-NanoScan)
- Department: Professur für Experimentalphysik (Rastersondenmikroskopie) (Prof. Dr. Maier)
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