AG Nanophysics using Scanning Probe Microscopy

Dozent/in:

Sabine Maier

Angaben:

Arbeitsgemeinschaft, 2 SWS

Termine:

Mo, 12:00 - 14:00, Raum n.V.

Nanophysics using Scaning Probe Microscopy

Dozent/in:

Sabine Maier

Angaben:

Vorlesung, 2 SWS, ECTS: 5

Termine:

Di, 14:15 - 16:00, SR 01.779
Vorbesprechung: Dienstag, 19.10.2021, 14:00 - 16:00 Uhr, TL 1.140

Studienrichtungen / Studienfächer:

WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA ab 1
WF LaP-SE ab 5

Inhalt:

1. Introduction in various scanning probe microscopy techniques

• Scanning tunneling microscopy (STM)

• Atomic force microscopy (AFM)

• Kelvin probe force microscopy (KPFM)

• Conductive atomic force microscopy (cAFM)

• Scanning Near-field microscopy (SNOM)

2. Complementary surface-science techniques

• X-Ray photoelectron spectroscopy (XPS)

• Low energy electron diffraction (LEED)

3. Introduction to nanophysics

• Atomic manipulation

• Nanoelectronics

• Nanomagnetism and spin-mapping

• Nanomechanics

• Self-assembly and surface reactions

Empfohlene Literatur:

1. B. Voigtländer, Scanning Probe Micorsocpy, Springer 2015
2. C. J. Chen, Introduction to scanning probe microscopy and spectroscopy, Oxford University Press 2008
3. E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy, Springer 2004
More references will be provided in the class.

Nanophysics using Scaning Probe Microscopy - Exercises

Dozent/in:

Sabine Maier

Angaben:

Übung

Termine:

Di, 16:00 - 17:00, SR 01.779
The time for the exercises can be changed and will be discussed in the first meeting

Studienrichtungen / Studienfächer:

WF Ph-BA ab 5
WF Ph-MA ab 1
WF PhM-BA ab 5
WF PhM-MA 1

Rastersondenmikroskopie

Dozent/in:

Sabine Maier

Angaben:

Seminar, 2 SWS

Termine:

Zeit n.V., Zoom-Meeting
Rastersondenmikroskopie